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PDF) A domain-specific approach for software development on Manycore platforms
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PDF) An adaptive BIST to detect multiple stuck-open faults in CMOS circuits
NiDS2022 (Novel & Intelligent Digital Systems) - ATHENS
PDF) Memory testing with a RISC microcontroller
PDF) On the Generation of Functional Test Programs for the Cache Replacement Logic
PDF) Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique
PDF) Efficient Test Compaction for Pseudo-Random Testing
PDF) Moduli Set Selection and Cost Estimation for RNS-Based FIR Filter and Filter Bank Design
PDF) Survival analysis for modeling critical events that communities may undergo in dynamic social networks
PDF) New Algorithms for Address Decoder Delay Faults and Bit Line Imbalance Faults
PDF) Extending Internet into Space – ESA DTN Testbed Implementation and Evaluation
PDF) Detection of Delay Faults in Memory Address Decoders
PDF) Accumulator-Based Weighted Pattern Generation.
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PDF) On the generation of pseudo-deterministic two-patterns test sequence with LFSRs.
PDF) Test Embedding with Discrete Logarithms
PDF) Detection of Delay Faults in Memory Address Decoders
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PDF) Modeling and Simulation of Efficient March Algorithm for Memory Testing
ERCIM News 96 by Peter Kunz - Issuu
PDF) A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences
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